Nơi xuất xứ
Shanghai, China
Độ dài tiêu cự
2.0nm or 4.0nm optional
Wavelength Accuracy
±0.8nm
Wavelength Repeatability
≤0.2nm
Optical System
Single Beam, Blazed Holographic Grating (1200 lines/mm)
Scan Speed
High, Medium, Low. Max.1000nm/minute
Stability
±0.002A/h (500nm,0A)
Noise
±0.2%T(0%T);±0.5%T(100%T);±0.001A (500nm)
Sample Compartment
Accommodate 5-100mm Pathlength Cuvette
Detector
Silicon Photodiode
Lamps
Tungsten Lamp & Deuterium Lamp (Pre-aligned)